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Communication and testing interfaces

COURSE: Communication and testing interfaces

Code: ФЕИТ00010

ECTS points: 6 ECTS

Number of classes per week: 3+0+0+3

Lecturer: prof. Mile Stojcev

Subject of the course content: Data acquisition systems: configuration and architecture, main building blocks. Sensors, intelligent sensors, standards and protocols. Conditioners, A/D and D/A converters, output devices. Industrial data networks. Software tools and programming. Remote connection interfaces. Synchronous and asynchronous communication: RS-232, RS-485, IEEE488, USB, I2C, SPI, CAN, LIN. Intelligent sensor interfaces: power line communication (PLC), communication over Internet, wireless transmission. Galvanic isolation, overvoltage protection. Communication buses, communication standards. Standard topologies: P2P, multidrop, high speed system buses. Synchronization and arbitration, GALS concept. On-chip buses, AMBA, CoreConnect, application specific busses, network on chip (NoC). Electronic testing: design for testability, delay tests, fast test interfaces, on-chip testing, memory testing, boundary-scan technique, built-in self test, mixed-signal circuit testing, RF testing.

Literature:

  1. James Peckol, Embedded Systems: A Contemporary Design Tool, John Wiley & Sons, 2007
  2. Sudep Pasricha, Nikil Dutt, On-Chip Communication Architectures, Elsevier, 2008
  3. Dimitris Gizopoulos, Advances in Electronic Testing: Challenges and Methodologies, Springer, 2006